• Title of article

    Influence of metal organic and inorganic precursors on spray pyrolyzed ceramic MgO (2 0 0) thin films for epitaxial over layers

  • Author/Authors

    A. Moses Ezhil Raj، نويسنده , , A.M. and Vijayalakshmi، نويسنده , , By K. T. Selvan ، نويسنده , , G. and Jayachandran، نويسنده , , M. and Sanjeeviraja، نويسنده , , C.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2008
  • Pages
    7
  • From page
    3773
  • To page
    3779
  • Abstract
    The MgO (2 0 0) surface is widely used as a substrate for epitaxial growth of superconducting and ferro-electric films. Highly oriented, single crystalline, extremely flat and transparent MgO films have been successfully deposited on quartz substrates by the chemical spray pyrolysis technique using economically viable metal organic and inorganic precursors under optimized conditions at the substrate temperature of 600 °C. Thermal analysis (TGA/DTA) in the temperature range 30–600 °C with the heating rate of 10 °C/min revealed the decomposition behavior of the precursors and confirmed the suitable substrate temperature range for film processing. The heat of reaction, ΔH due to decomposition of metal organic precursor contributed additional heat energy to the substrate for better crystallization. The intensity of the (2 0 0) peak in X-ray diffraction (XRD) measurements and the smooth surface profiles revealed the dependency of precursor on film formation. The compositional purity and the metal–oxide bond formation were tested for all the films. UV–Vis–NIR optical absorption in the 200–1500 nm range revealed an optical transmittance above 80% and the absorption edge at about 238 nm corresponding to an optical band gap Eg = 5.25 eV. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) micrographs of MgO films confirmed better crystallinity with larger grain size (0.85 μm) and reduced surface roughness (26 nm), respectively.
  • Keywords
    ceramics , Heavy metal oxides , X-ray diffraction , Atomic force and scanning tunneling microscopy , FT-IR measurements , Scanning electron microscopy
  • Journal title
    Journal of Non-Crystalline Solids
  • Serial Year
    2008
  • Journal title
    Journal of Non-Crystalline Solids
  • Record number

    1380744