Title of article :
Phase transitions of bismuth clusters
Author/Authors :
Ikemoto، نويسنده , , H. and Miyanaga، نويسنده , , T. and Kiuchi، نويسنده , , T.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Pages :
5
From page :
3394
To page :
3398
Abstract :
X-ray diffraction patterns, extended X-ray absorption fine structure, and optical absorption coefficients were measured in order to investigate the size-dependence of structural and optical phase transitions of bismuth clusters. Contrary to the case of 15-nm thick films, peaks due to crystalline Bi were not observed in X-ray diffraction patterns of as-deposited 0.5-nm thick films. Optical absorption coefficients of the 0.5-nm thick films are small compared with those of 100-nm thick films, and an optical gap appears in the 0.5-nm thick films. These results show directly the phase transition of bismuth clusters from semi-metallic nanocrystalline to semiconducting amorphous-like clusters with decreasing size.
Keywords :
X-ray diffraction , EXAFS , Optical properties , Clusters , Phase transitions
Journal title :
Journal of Non-Crystalline Solids
Serial Year :
2007
Journal title :
Journal of Non-Crystalline Solids
Record number :
1381515
Link To Document :
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