• Title of article

    Electron beam probing of silica surface layers on alumina

  • Author/Authors

    Cornet، نويسنده , , N. and Goeuriot، نويسنده , , D. and Touzin، نويسنده , , M. and Guerret-Piécourt، نويسنده , , C. and Juvé، نويسنده , , D. and Tréheux، نويسنده , , D. and Fitting، نويسنده , , H.-J.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2009
  • Pages
    4
  • From page
    1111
  • To page
    1114
  • Abstract
    The electron beam induced self-consistent charge injection and transport in a layered insulator SiO2–Al2O3 is described by means of an electron–hole flight–drift model FDM and an iterative computer simulation. Thermal and field-enhanced detrapping are included by the Poole–Frenkel effect. The surface layer with a modified electric surface conductivity is included which describes the surface leakage currents. Furthermore, it will lead to particular charge incorporation at the interface between the surface layer and the bulk substrate. As a main result the time-dependent spatial distributions of currents j(x,t), charges ρ(x,t), field F(x,t), and potential V(x,t) are obtained. The spatial charge distribution with depth shows a quadro-polar plus–minus–plus–minus structure in nanometer dimension.
  • Keywords
    Electrical and electronic properties , relaxation electric modulus , Measurement techniques , SEM S100 , Films and coatings , dielectric properties , Thermally stimulated and depolarization current , Microscopy , Conductivity , Modeling and si , Scanning electron microscopy
  • Journal title
    Journal of Non-Crystalline Solids
  • Serial Year
    2009
  • Journal title
    Journal of Non-Crystalline Solids
  • Record number

    1381709