Title of article :
Electron beam probing of silica surface layers on alumina
Author/Authors :
Cornet، نويسنده , , N. and Goeuriot، نويسنده , , D. and Touzin، نويسنده , , M. and Guerret-Piécourt، نويسنده , , C. and Juvé، نويسنده , , D. and Tréheux، نويسنده , , D. and Fitting، نويسنده , , H.-J.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2009
Abstract :
The electron beam induced self-consistent charge injection and transport in a layered insulator SiO2–Al2O3 is described by means of an electron–hole flight–drift model FDM and an iterative computer simulation. Thermal and field-enhanced detrapping are included by the Poole–Frenkel effect. The surface layer with a modified electric surface conductivity is included which describes the surface leakage currents. Furthermore, it will lead to particular charge incorporation at the interface between the surface layer and the bulk substrate. As a main result the time-dependent spatial distributions of currents j(x,t), charges ρ(x,t), field F(x,t), and potential V(x,t) are obtained. The spatial charge distribution with depth shows a quadro-polar plus–minus–plus–minus structure in nanometer dimension.
Keywords :
Electrical and electronic properties , relaxation electric modulus , Measurement techniques , SEM S100 , Films and coatings , dielectric properties , Thermally stimulated and depolarization current , Microscopy , Conductivity , Modeling and si , Scanning electron microscopy
Journal title :
Journal of Non-Crystalline Solids
Journal title :
Journal of Non-Crystalline Solids