Author/Authors :
Naik، نويسنده , , Ramakanta and Adarsh، نويسنده , , K.V. and Ganesan، نويسنده , , R. and Sangunni، نويسنده , , K.S. and Kokenyesi، نويسنده , , S. and Deshpande، نويسنده , , Uday and Shripathi، نويسنده , , T.، نويسنده ,
Abstract :
Photoinduced diffusion in Se/As2S3 and Sb/As2S3 nanomultilayered thin films are studied by X-ray photoelectron spectroscopy (XPS). The XPS measurements show the atomic movements during photoinduced diffusion in Se/As2S3 and Sb/As2S3 nanomultilayered film. The analysis of experimental data describes the nature of light induced changes in different structural units.
