Author/Authors :
L. Tkatch، نويسنده , , V.I. and Rassolov، نويسنده , , S.G. and Popov، نويسنده , , V.V. and Maksimov، نويسنده , , V.V. and Maslov، نويسنده , , V.V. and Nosenko، نويسنده , , V.K. and Aronin، نويسنده , , A.S. and Abrosimova، نويسنده , , G.E. and Rybchenko، نويسنده , , O.G.، نويسنده ,
Abstract :
Kinetics of the first crystallization stage of Al86Ni2Co5.8Gd5.7Si0.5 amorphous alloy and structure of the partially crystallized specimens were investigated by measurements of electrical resistance, X-ray diffraction and transmission electron microscopy. The presence of Al nanocrystals and eutectic colonies consisted of mutually oriented crystals of Al and metastable phase was found. The transient nucleation and slowing-down diffusion-limited growth and the interface-controlled growth of the quenched-in nuclei were identified as mechanisms of formation of the Al nanocrystals and eutectic colonies, respectively.
Keywords :
Transmission electron microscopy (TEM) , X-Ray Diffraction (XRD) , Aluminum alloys , Melt-spinning , crystallization
