Title of article :
Titanium reduction processes in oxide glasses under electronic irradiation
Author/Authors :
Ollier، نويسنده , , N. and Lombard، نويسنده , , P. and Farges، نويسنده , , F. and Boizot، نويسنده , , B.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Pages :
6
From page :
480
To page :
485
Abstract :
Borosilicate and disilicate glasses doped with 0–2 mol% of TiO2 have been irradiated with 2 MeV electrons. Reduction of Ti4+ is attested by the presence of an intense electronic paramagnetic resonance (EPR) signal around g = 1.92 corresponding to Ti3+, not observed in samples that were not irradiated. Moreover, two distinct sites of Ti3+ have been detected in each glass composition. Ti–K-edge X-ray absorption near edge structure (XANES) experiment and more precisely the pre-edge analysis of non-irradiated samples indicates the presence of four, five and six coordinated Ti(IV) in borosilicate glass compositions. In contrast, the average Ti(IV) coordination in DS composition is a mixture between fivefold and sixfold. In irradiated glasses, the Ti–K-edge energy (as well as the pre-edge position) shows a shift to smaller energies, which we suggest is caused by Ti3+. Comparison between EPR, Raman and XANES results in a coherent description of Ti4+ reduction process in the glass samples.
Keywords :
Radiation effects , Borosilicates , radiation , electron spin resonance , X-ray Absorption , silicates
Journal title :
Journal of Non-Crystalline Solids
Serial Year :
2008
Journal title :
Journal of Non-Crystalline Solids
Record number :
1382552
Link To Document :
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