Title of article :
Glasses for lithography
Author/Authors :
Jain، نويسنده , , H. and Vlcek، نويسنده , , M.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Pages :
6
From page :
1401
To page :
1406
Abstract :
The highest resolution in a lithographic process is often determined by the properties of the resist material. With the currently used polymeric resists, a resolution of better than 100 nm has been achieved under manufacturing conditions, but the future nanoscale devices will require a 10 times superior resolution. In this paper we present an overview of the resist materials, especially with regard to limiting resolution. In principle, inorganic resists should have higher limiting resolution than polymer resists due to smaller fundamental structural units and stronger bonds in the former. However, compositional and/or structural inhomogeneities may limit their ultimate resolution. New results are presented that indicate chalcogenide glasses as promising photo and electron beam resists, which also have the advantages of greater hardness, resistance to acids, easy fabrication in thin film form, and the unique phenomena like radiation enhanced diffusion.
Keywords :
chalcogenides , Photoinduced effects
Journal title :
Journal of Non-Crystalline Solids
Serial Year :
2008
Journal title :
Journal of Non-Crystalline Solids
Record number :
1382697
Link To Document :
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