Author/Authors :
Liu، نويسنده , , S.M. and Li، نويسنده , , D.C. and Hu، نويسنده , , W.T. and Qin، نويسنده , , G.Q. and Li، نويسنده , , L.F.، نويسنده ,
Abstract :
Ion-beam deposition of tourmaline on glass substrate was investigated. X-ray fluorescence has been used to characterize surface composition of glass before and after deposition. The surface morphologies of glass were investigated by atomic force microscope. The crystallographic properties of the prepared films were evaluated by X-ray diffraction. Fourier infrared spectroscopy was used to determine infrared transmission. It is concluded that symmetrical island structure tourmaline film can be deposited on the glass substrate. The average size of the tourmaline grain is about 1 μm.