Title of article :
Normal and anti Meyer–Neldel rule in conductivity of highly crystallized undoped microcrystalline silicon films
Author/Authors :
Ram، نويسنده , , Sanjay K. and Kumar، نويسنده , , Satyendra and Roca i Cabarrocas، نويسنده , , P.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Pages :
5
From page :
2263
To page :
2267
Abstract :
We have studied the electrical conductivity behavior of highly crystallized undoped hydrogenated microcrystalline silicon (μc-Si:H) films having different microstructures. The dark conductivity is seen to follow Meyer–Neldel rule (MNR) in some films and anti-MNR in others, which has been explained on the basis of variation in the film microstructure and the corresponding changes in the effective density of states distributions. A band tail transport and statistical shift of Fermi level are used to explain the origin of MNR as well as anti-MNR in our samples. The observation of MNR and anti-MNR in electrical transport behavior of μc-Si:H is discussed in terms of the basic underlying physics of their origin and the significance of these relationships.
Keywords :
solar cells , Thin film transistors , Electrical and electronic properties , chemical vapor deposition , Films and coatings , ellipsometry , Plasma deposition , Microcrystallinity , microstructure , Surfaces and interfaces , photoconductivity , Amorphous semiconductors , Conductivity
Journal title :
Journal of Non-Crystalline Solids
Serial Year :
2008
Journal title :
Journal of Non-Crystalline Solids
Record number :
1382771
Link To Document :
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