Title of article :
Correlation between micro-roughness, surface chemistry, and performance of crystalline Si/amorphous Si:H:Cl hetero-junction solar cells
Author/Authors :
Matsui، نويسنده , , H. and Saito، نويسنده , , T. and Saha، نويسنده , , J.K. and Shirai، نويسنده , , H.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Abstract :
The correlation between micro-roughness, surface chemistry, and performance of crystalline Si/amorphous Si:H:Cl hetero-junction solar cells is discussed through a deposition study of amorphous Si:H:Cl (a-Si:H:Cl) films by rf plasma-enhanced chemical vapor deposition using a SiH2Cl2–H2 mixture. The degree of H- and Cl-termination on the growing surface determined the degree of micro-roughness at the p-type a-Si:H:Cl/intrinsic a-Si:H:Cl interface and solar cell performance. A higher degree of Cl-termination compared to H-termination was effective to suppress the micro-roughness at the growing surface and oxygen incorporation into the film, as well as chemical reduction of the intrinsic a-Si:H:Cl layer during the underneath p-layer formation. The study showed that a-Si:H:Cl deposited from SiH2Cl2 is a potential material for c-Si hetero-junction solar cells with an intrinsic a-Si:H:Cl thin layer.
Keywords :
Heterojunctions , Photovoltaics , X-ray diffraction , chemical vapor deposition , Films and coatings , Plasma deposition , microstructure , Microcrystallinity , Optical properties , FTIR measurements , Amorphous semiconductors , Silicon , solar cells , Devices , Diffraction and scattering measurements
Journal title :
Journal of Non-Crystalline Solids
Journal title :
Journal of Non-Crystalline Solids