Title of article :
Analyzing a firm’s international portfolio of technological knowledge: A declarative ontology-based OWL approach for patent documents
Author/Authors :
Bermudez-Edo، نويسنده , , Maria and Noguera، نويسنده , , Manuel and Hurtado-Torres، نويسنده , , Nuria and Hurtado، نويسنده , , Maria Visitacion and Garrido، نويسنده , , Jose Luis، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2013
Pages :
8
From page :
358
To page :
365
Abstract :
Patent databases contain large amounts of information about the inventions and metadata of corporate patents (such as the technological domain they belong to, their applicants, and inventors). These databases are available online but since they do not provide explicit information about the relationships between different patent metadata, it is not possible for computers to automatically process such relationships. Several patent ontologies have been proposed so far in order to provide patent knowledge bases with semantics by merging information from different databases and establishing a common vocabulary. However, previous ontology literature has paid limited attention to the representation of specific relationships among metadata and the design of reasoning procedures that would allow some information not explicitly specified in the databases or ontologies to be inferred. This article proposes a methodological approach for the definition of relationships and reasoning tasks for patent analysis by using patent ontologies, and provides a real illustration of its potential in the context of international flows of research knowledge. This declarative method is based on the formal definition of key patent analysis indicators (KPAIs). The case study analysis is relevant because global competition and the importance of multinational firms in the patent process have resulted in firms not only patenting on their domestic markets but also transferring their patents to other markets and developing patents in different countries. In this context, it is important to analyze the connections between the patenting processes and the international knowledge flows of research and development. More specifically, the paper illustrates the applicability of the proposed methodology by classifying patents into the five patterns of internationalization identified by the Organization for Economic Co-operation and Development (OECD).
Keywords :
Patent analysis , OWL , Ontology-driven engineering , Firm innovation analysis , Ontology , Ontology engineering
Journal title :
ADVANCED ENGINEERING INFORMATICS
Serial Year :
2013
Journal title :
ADVANCED ENGINEERING INFORMATICS
Record number :
1384910
Link To Document :
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