Application of simulated annealing for simultaneous retrieval of particle size distribution and refractive index

This paper describes the application of the simulated annealing technique for the simultaneous retrieval of particle size distribution and refractive index based on polarization modulated scattering (PMS) measurements. The PMS technique is a well-established method to measure multiple elements of the Mueller scattering matrix. However, the inference of the scatterers’ properties (e.g., the size distribution function and refractive index) from such measurements involves solving an ill-conditioned inverse problem. In this paper, a new inversion technique was demonstrated to infer particle properties from PMS measurements. The new technique formulated the inverse problem into a minimization problem, which is then solved by the simulated annealing technique. Both numerical and experimental investigation on the new inversion technique was presented in the paper. The results obtained demonstrated the robustness and reliability of the new algorithm, and supported its expanded applications in scientific and technological areas involving particulates/aerosols.