مرکز منطقه ای اطلاع رساني علوم و فناوري - Bayesian reliability modeling for masked system lifetime data

Title of article :

Bayesian reliability modeling for masked system lifetime data

Author/Authors :

Lynn Kuo، نويسنده , , Tae Young Yang، نويسنده ,

Issue Information :

فصلنامه با شماره پیاپی سال 2000

Pages :

From page :

229

To page :

241

Keywords :

Competing risk , Gibbs sampling , Incomplete data , Latent variable model

Journal title :

Statistics and Probability Letters

Serial Year :

2000

Journal title :

Statistics and Probability Letters

Record number :

139338

Link To Document :