Dielectric data of ceramic substrates at high frequencies

The dielectric constants of standard ceramic substrates like alumina and LTCC have been determined in the frequency range from 1 to 50 GHz. For the measurements cylindrical disk resonators and printed microstrip line resonators on substrates have been prepared. The RF-data have been measured with network analyzers and suitable wafer probe stations, the calculations of the dielectric data have been done on basis of two different simulation programs. The preparation of the samples and the test conditions of both resonator methods have proven to yield reliable results over a wide frequency range.