Title of article :
Structure–properties correlations for barium titanate thin films obtained by rf-sputtering
Author/Authors :
Ianculescu، نويسنده , , Adelina and Despax، نويسنده , , Bernard and Bley، نويسنده , , Vincent and Lebey، نويسنده , , Thierry and Gavril?، نويسنده , , Raluca and Dr?gan، نويسنده , , Nicolae، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Pages :
7
From page :
1129
To page :
1135
Abstract :
Stoichiometric thin films were deposited by rf-magnetron sputtering from a BaTiO3 ceramic target on Pd foils used as substrates. Polycrystalline BaTiO3 films with different grain sizes were obtained by post-deposition heat treatment in air, at 900 °C for 8 h. A multi-step deposition–annealing technique was used in order to improve the compactness and therefore, the dielectric behaviour. ructural characteristics and the surface topography varied obviously with both films thickness and deposition–annealing procedure. X-ray diffraction data pointed out that the so-called “pseudocubic” phase, generally reported for such fine-grained thin films, does not involve only a highly distorted unit cell, but consists obviously, in our case, from a mixture of crystalline phases, with tetragonal and cubic symmetry, respectively. electric properties (relative permittivity and loss tangent) showed small frequency dispersion. The BaTiO3 film of 0.6 μm thickness obtained by four deposition–annealing cycles exhibited a dielectric constant of ∼700 and a dissipation factor of 0.06 at 100 kHz.
Keywords :
X-ray methods , films , BaTiO3 , dielectric properties , grain size
Journal title :
Journal of the European Ceramic Society
Serial Year :
2007
Journal title :
Journal of the European Ceramic Society
Record number :
1408661
Link To Document :
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