Investigation of ultra-thin carbon films on magnetic disks with super smooth glass substrate

This paper presents new and improved approaches used in a variety of analytical methods (AFM, TEM, XPS, TOF-SIMS, GIXR, HR-RBS, Raman, and GF-AAS) to study the properties of ultra-thin carbon films. Despite fact that a magnetic layer is covered by the thickness of 1.2 nm carbon films in the case of TEM observation, the sputtered carbon films over 3 nm thick are excellent in view of the coverage and corrosion resistance. This film thickness is suitable for use with 60–100 Gbits/in2 recording media.