Accelerated nano-fretting testing of Si(1 0 0)

A nano-fretting test technique has been recently developed to enable the in situ study of wear at the micro- and nano-scale. It has been used to study the small scale wear of Si(1 0 0) using a 4.6 μm spheroconical indenter as test probe over the applied load range 30–300 mN. Contact damage assessment by in situ measurements of probe displacement were supplemented by post-test SEM imaging and wear scar analysis by confocal microscopy. The wear behaviour was dependent on the rate of initial loading. When the load was applied abruptly (<0.3 s), radial and lateral cracking and material removal was observed and large displacement jumps (pop-ins) were observed during the subsequent 1000 s constant load nano-fretting test. The crack morphology was very similar to that in repetitive nano-impact tests and conventional nanoindentation at higher applied load with the same probe. In contrast, when the load was applied more slowly (10 s) radial cracking was not observed and there was a distinct threshold load (∼100 mN) marking the transition to a more severe wear mode with extensive lateral cracking and material removal.