Title of article :
Photoemission and absorption spectroscopy of carbon nanotube interfacial interaction
Author/Authors :
Tran، نويسنده , , N.H. and Wilson، نويسنده , , M.A. and Milev، نويسنده , , A.S. and Bartlett، نويسنده , , J.R. and Lamb، نويسنده , , R.N. and Martin، نويسنده , , D. and Kannangara، نويسنده , , G.S.K.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2009
Pages :
19
From page :
23
To page :
41
Abstract :
Element-specific techniques including near edge X-ray absorption fine structure, extended X-ray absorption fine structure and X-ray photoemission spectroscopy for the characterization of the carbon nanotube interfacial interactions are reviewed. These techniques involve soft and hard X-rays from the laboratory-based and synchrotron radiation facilities. The results provided information of how the nano-particles of catalysts are involved in the initial stage of nanotube growth, the nanotube chemical properties after purification, functionalization, doping and composite formation.
Keywords :
X-ray photoemission spectroscopy (XPS) , Thin film , Interface , Single Walled Carbon Nanotube (SWCNT) , Double walled carbon nanotube (DWCNT) , Multi walled carbon nanotube (MWCNT) , Near edge X-ray absorption fine structure (NEXAFS) , surface , Chemical vapour deposition (CVD) , Extended X-ray absorption fine structure (EXAFS)
Journal title :
Advances in Colloid and Interface Science
Serial Year :
2009
Journal title :
Advances in Colloid and Interface Science
Record number :
1432198
Link To Document :
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