Title of article
Micrometric patterning process of sol–gel SnO2, In2O3 and WO3 thin film for gas sensing applications: Towards silicon technology integration
Author/Authors
Francioso، نويسنده , , L. Lo Russo، نويسنده , , M. and Taurino، نويسنده , , A.M. and Siciliano، نويسنده , , P.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
8
From page
159
To page
166
Abstract
Gas sensors research moves nowadays towards new applications of traditional metal oxide gas sensors into new fields like food quality, security applications and combustion control.
s an implementation of this kind of transducers requires often a reduction of sensor dimensions, introduction of mature silicon technology substrates and fabrication methods. This work focuses on results obtained about implementation of reliable, selective, subtractive processes to perform high resolution patterning of different metal oxide films, deposited by cheap sol–gel technology onto oxidized silicon wafer or provided with thin layers of sputtered silicon nitride.
nnovations in this paper deal with an experimental evaluation of different methods to perform etching processes for three different sol–gel metal oxide materials deposited on standard dielectric layers, and evaluation of photoresist mask chemical inertness.
Keywords
Wet etching , High resolution patterning , Silicon technology , Sol–gel , Metal oxide film
Journal title
Sensors and Actuators B: Chemical
Serial Year
2006
Journal title
Sensors and Actuators B: Chemical
Record number
1438472
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