Title of article
High-density inductively coupled plasma chemical vapor deposition of silicon nitride for solar cell application
Author/Authors
Parm، نويسنده , , I.O and Kim، نويسنده , , K and Lim، نويسنده , , D.G. and Lee، نويسنده , , J.H and Heo، نويسنده , , J.H. and Kim، نويسنده , , J and Kim، نويسنده , , D.S. and LEE، نويسنده , , S.H and Yi، نويسنده , , J، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
9
From page
97
To page
105
Abstract
The silicon nitride films were deposited by means of high-density inductively coupled plasma chemical vapor deposition in a planar coil reactor. The process gases used were pure nitrogen and a mixture of silane and helium. Passivated by silicon nitride, solar cells show efficiency above 13%. Strong H-atom release from the growing SiN film and Si–N bond healing are responsible for the improved electrical and passivation properties of SiN film. This paper presents the optimal refractive index of SiN for single layer antireflection coating as well as double layer antireflection coating in solar cell applications.
Keywords
Silicon nitride films , CVD , PLASMA , Optimal refractive index
Journal title
Solar Energy Materials and Solar Cells
Serial Year
2002
Journal title
Solar Energy Materials and Solar Cells
Record number
1478130
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