Title of article :
Mechanism of hydrogen interaction with the growing silicon film
Author/Authors :
Rath، نويسنده , , J.K. and Klerk، نويسنده , , L.A. and Gordijn، نويسنده , , A. and Schropp، نويسنده , , R.E.I.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
9
From page :
3385
To page :
3393
Abstract :
The hydrogen reaction on a hydrogenated silicon film is in two phases. This is manifested in slowing down of the hydrogen loss at the growing film. The slow down occurs in phases and both the processes have exponential character. The first phase consists of hydrogen incorporation into the layer and this occurs within the first 50 s. The second phase is of etching. This is confirmed by the similarity between the rate of hydrogen loss in the second phase and the rate of production of silyl species.
Keywords :
Thin film , microcrystalline silicon , Layer-by-layer deposition , VHF PECVD , Mass Spectroscopy
Journal title :
Solar Energy Materials and Solar Cells
Serial Year :
2006
Journal title :
Solar Energy Materials and Solar Cells
Record number :
1480882
Link To Document :
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