Characterization of the SnO2:F/CdS:In structures prepared by the spray pyrolysis technique

SnO2:F/CdS:In bilayers were spray-deposited on glass substrates. The structures were characterized by recording and investigating their transmittance curves, I–V plots, X-ray diffractograms (XRD) and by observing their scanning electron microscope (SEM) images. From the I–V plots it was found that the SnO2:F forms an ohmic or quasi-ohmic contact with CdS:In. XRD patterns show the polycrystalline nature of the films and show that there is a small shift in the position of the (2 0 0) line of SnO2:F without the appearance of new peaks. The morphology of the structures are compared with those of SnO2:F alone and CdS:In alone on glass substrates.