Title of article :
Anti-reflective microcrystalline silicon oxide p-layer for thin-film silicon solar cells on ZnO
Author/Authors :
Schwanitz، نويسنده , , Konrad and Klein، نويسنده , , Stefan and Stolley، نويسنده , , Tobias and Rohde، نويسنده , , Martin and Severin، نويسنده , , Daniel and Trassl، نويسنده , , Roland، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2012
Pages :
5
From page :
187
To page :
191
Abstract :
As a result from the development of silicon thin-film solar cells that had been conducted at Applied Materials over the last few years, we present a new kind of microcrystalline silicon oxide (μc-SiOx:H) based p-layer for the application in amorphous/microcrystalline (a-Si:H/μc-Si:H) tandem solar cells on ZnO substrates. The refractive index of this p-layer can be adjusted in the range 2–3.5 and therefore serves as a refractive index matching layer between ZnO (n∼2) and silicon (n∼4). By applying such a layer the reflection of solar cells can be reduced to 3%. This results in a significant short circuit current increase in thin-film solar cells. As a follow up to the recently published results of large area thin film silicon modules by us [1,2], we describe in this paper in detail the material properties of this new silicon oxide p-layer, the optimization of electrical and optical properties in solar cells and also the impact on the light induced degradation of a-Si/μc-Si tandem junction cells.
Keywords :
PECVD , a-Si:H/?c-Si:H tandem cells , Thin film solar cells , ZNO , Silicon oxide p-layer
Journal title :
Solar Energy Materials and Solar Cells
Serial Year :
2012
Journal title :
Solar Energy Materials and Solar Cells
Record number :
1486717
Link To Document :
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