Title of article :
Intrinsic burn-in efficiency loss of small-molecule organic photovoltaic cells due to exciton-induced trap formation
Author/Authors :
Tong، نويسنده , , Xiaoran and Wang، نويسنده , , Nana and Slootsky، نويسنده , , Michael K. Yu، نويسنده , , Junsheng and Forrest، نويسنده , , Stephen R.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2013
Pages :
8
From page :
116
To page :
123
Abstract :
The intrinsic degradation mechanisms leading to the initial burn-in deterioration in power conversion efficiency in small-molecule-based organic photovoltaics (OPVs) are studied. Specifically, we examine degradation in archetype boron subphthalocyanine chloride/fullerene OPVs in the absence of atmospheric contaminants such as water and oxygen. During the initial burn-in period (<20 h), planar OPVs employing C60 as the acceptor exhibits a rapid decrease in efficiency that is primarily due to a reduction in photocurrent contributed by excitons generated in C60, as observed by the changes in the spectrally-resolved external quantum efficiency. We develop an analytical model that ascribes the decrease in power conversion efficiency with aging to an energetically-driven increase in the density of exciton-induced quenching sites that hinder exciton diffusion to the donor–acceptor interface. This mechanism is mitigated by employing a C70 acceptor, or a mixed donor–acceptor active layer where excitons are rapidly dissociated following photogeneration, thereby significantly reducing their lifetime and density.
Keywords :
Small molecule , Lifetime , aging , Reliability
Journal title :
Solar Energy Materials and Solar Cells
Serial Year :
2013
Journal title :
Solar Energy Materials and Solar Cells
Record number :
1488742
Link To Document :
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