Title of article :
Microstructure and creep behavior of directionally solidified TiAl-base alloys
Author/Authors :
Johnson، نويسنده , , D.R and Lee، نويسنده , , H.N and Muto، نويسنده , , S and Yamanaka، نويسنده , , T and Inui، نويسنده , , H and Yamaguchi، نويسنده , , M، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
5
From page :
923
To page :
927
Abstract :
Tensile creep tests were conducted on directionally solidified TiAl alloys to discern the effect of alloying and lamellar orientation. A seeding technique was used to align the TiAl/Ti3Al lamellar structure parallel to the growth direction for alloys of Ti–47Al, Ti–46Al–0.5Si–0.5X (X=Re, W, Mo, and Cr), and Ti–46Al–1.5Mo–0.2C (at.%). Tensile creep tests were performed at 750 °C using applied stresses of 210 and 240 MPa. Aligning the lamellar microstructure greatly enhances the creep resistance which can further be improved by additional alloying.
Keywords :
A. Titanium aluminides , based on TiAl , B. Creep (properties and mechanisms , mechanical properties at high temperatures , C. Crystal growth
Journal title :
Intermetallics
Serial Year :
2001
Journal title :
Intermetallics
Record number :
1500918
Link To Document :
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