Title of article
Bypassing shear band nucleation and ductilization of an amorphous–crystalline nanolaminate in tension
Author/Authors
Nieh، نويسنده , , T.G. and Wadsworth، نويسنده , , J.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2008
Pages
4
From page
1156
To page
1159
Abstract
Based on a recent nucleation model, the critical shear band nucleus size has been estimated to be about 20 nm; we, therefore, predict that if the characteristic dimension of an amorphous phase is <20 nm, catastrophic failure can be avoided. We reproduced a previous tension test on an amorphous–crystalline Cu–Zr laminate, having amorphous layers thinner than 10 nm. The nanolaminate exhibited a remarkable tensile elongation of 4%. The fracture surface of this newly tested material was examined.
Keywords
C. Thin films , A. Composites , based on the metallic glass matrix , B. Brittleness and ductility
Journal title
Intermetallics
Serial Year
2008
Journal title
Intermetallics
Record number
1504323
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