Title of article :
PULWIN: A program for analyzing powder X-ray diffraction patterns
Author/Authors :
Bruckner، Sergio نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Abstract :
A computer program is presented that allows for the analysis of powder X-ray diffraction (XRD) patterns. Some peculiar features of the program are: the aptitude for dealing with diffractograms obtained from semicrystalline polymer samples and the ability to evaluate XRD patterns collected with CPS 120 detectors. The program is available as freeware via anonymous ftp at: ftp.cc.uniud.it under the directory/pulwin/.
Keywords :
X-ray diffraction , grazing incidence , residual stress evaluation , thin films
Journal title :
POWDER DIFFRACTION
Journal title :
POWDER DIFFRACTION