Title of article :
PULWIN: A program for analyzing powder X-ray diffraction patterns
Author/Authors :
Bruckner، Sergio نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
-217
From page :
218
To page :
0
Abstract :
A computer program is presented that allows for the analysis of powder X-ray diffraction (XRD) patterns. Some peculiar features of the program are: the aptitude for dealing with diffractograms obtained from semicrystalline polymer samples and the ability to evaluate XRD patterns collected with CPS 120 detectors. The program is available as freeware via anonymous ftp at: ftp.cc.uniud.it under the directory/pulwin/.
Keywords :
X-ray diffraction , grazing incidence , residual stress evaluation , thin films
Journal title :
POWDER DIFFRACTION
Serial Year :
2000
Journal title :
POWDER DIFFRACTION
Record number :
15214
Link To Document :
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