Title of article :
X-ray powder diffraction data and Rietveld refinement for Ln6WO12 (Ln=Y,Ho)
Author/Authors :
Benard-Rocherulle، P. نويسنده , , Diot، N. نويسنده , , Marchand، R. نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Abstract :
A computer program is presented that allows for the analysis of powder X-ray diffraction (XRD) patterns. Some peculiar features of the program are: the aptitude for dealing with diffractograms obtained from semicrystalline polymer samples and the ability to evaluate XRD patterns collected with CPS 120 detectors. The program is available as freeware via anonymous ftp at: ftp.cc.uniud.it under the directory/pulwin/.
Keywords :
X-ray powder diffraction , defect fluorite structure , Rietveld refinement , Ln7O12 rare earth binary oxides , rare earth tungstates
Journal title :
POWDER DIFFRACTION
Journal title :
POWDER DIFFRACTION
