Title of article :
X-ray powder diffraction data for delta-Na2Si2O5
Author/Authors :
Kahlenberg، V. نويسنده , , Wendschuh-Josties، M. نويسنده , , Fischer، R. X. نويسنده , , Bauer، H. نويسنده , , Holz، J. نويسنده , , Schimmel، G. نويسنده , , Tapper، A. نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Abstract :
The X-ray powder diffraction data for delta-Na2Si2O5 are reported. The sample was prepared from water glass solution applied to pressed powder tablets of finely ground quartz using a heating program with a maximal temperature of 700 °C. The crystallographic data for delta-disilicate obtained from a Rietveld analysis are: space group P2(1) ln, a=8.3818(4)A. b= 12.0726(5) A, c =4.8455(2)A. beta=90.303(5)°, V-490.3lA^3, Z=4, and D(calc=2A6Sg/cm^3
Keywords :
X-ray powder diffraction , Guinier diffractometer , matlockite , BaFI
Journal title :
POWDER DIFFRACTION
Journal title :
POWDER DIFFRACTION
