Failure-censored accelerated life test sampling plans for Weibull distribution under expected test time constraint

This paper considers the design of life-test sampling plans based on failure-censored accelerated life tests. The lifetime distribution of products is assumed to be Weibull with a scale parameter that is a log linear function of a (possibly transformed) stress. Two levels of stress higher than the use condition stress, high and low, are used. Sampling plans with equal expected test times at high and low test stresses which satisfy the producerʹs and consumerʹs risk requirements and minimize the asymptotic variance of the test statistic used to decide lot acceptability are obtained. The properties of the proposed life-test sampling plans are investigated.