Title of article :
Dynamic reliability via computational solution of generalized state-transition equations for entry-time processes
Author/Authors :
Nelson، نويسنده , , Paul and Wang، نويسنده , , Shuwen، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Pages :
13
From page :
1281
To page :
1293
Abstract :
Entry-time processes are finite-state continuous-time jump processes with transition rates depending only on the two states involved, the calendar time, and the most recent arrival time (entry time). Entry-time processes are transformed into Markov processes via the standard technique of incorporating entry time into the state variables. It is shown that the associated state-transition (Chapman–Kolmogorov) equations can be written as a coupled pair of integrodifferential equations. A finite-difference approximation to these equations is developed. This computational approach is verified, and some of its properties delineated, via two hypothetical examples. One of these examples admits a semi-analytic solution, while simulations provide the base of comparison for the other.
Keywords :
Chapman–Kolmogorov equations , State model , Computational solution , Dynamic reliability , Semi-Markov processes , Entry-time process
Journal title :
Reliability Engineering and System Safety
Serial Year :
2007
Journal title :
Reliability Engineering and System Safety
Record number :
1571816
Link To Document :
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