Structural and impedance studies on LaF3 thin films prepared by vacuum evaporation

Lanthanum fluoride thin film has been deposited on glass substrates by PVD method at various deposition temperatures (Ts), viz, 300, 473, 573 and 673 K. The hexagonal phase LaF3 film has been detected by using glancing angle XRD analysis. The structural parameters such as lattice constants, grain size and micro-strain has been calculated from the XRD data. The F− ion conduction through the grain and grain boundary has been analyzed using impedance analysis. The modulus spectra reveals the non-Debye nature and the distribution of relaxation times of the film.