Title of article :
Dynamic analysis of bifurcating, non-linear thin film micro-structures
Author/Authors :
Carey، نويسنده , , M.W. and Chase، نويسنده , , J.Geoffrey and Carr، نويسنده , , A.J. and Kowarz، نويسنده , , M.W.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Abstract :
As micro-device application in consumer and commercial products develops, efficient tools are required to simulate device dynamics and assess structural performance. An integrated methodology is developed for studying the dynamics of thin film bifurcating structures. Results are presented for a generic thin film structure, which exhibit classical electro-mechanical hysteresis. Such structures can be used to produce light modulating micro-electro-mechanical system (MEMS) devices.
Keywords :
Dynamic , Residual stress , Large deflection , Geometric stiffness , Hybrid stress , Newmark constant average acceleration , Bifurcation , Electrostatic , Finite element
Journal title :
Engineering Structures
Journal title :
Engineering Structures