Title of article
Nickel sulfur thin films deposited by ECALE: Electrochemical, XPS and AFM characterization
Author/Authors
Loglio، نويسنده , , F. and Innocenti، نويسنده , , M. and Jarek، نويسنده , , A. and Caporali، نويسنده , , S. and Pasquini، نويسنده , , I. and Foresti، نويسنده , , M.L.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2010
Pages
6
From page
15
To page
20
Abstract
This paper reports on a study of the electrodeposition of nickel sulfide thin films on Ag(1 1 1) by the Electrochemical Atomic Layer Epitaxy (ECALE) technique. The multilayer growth of nickel sulfide has been studied by cyclic and stripping voltammetry. The composition of the films was studied by XPS analysis and the morphology was studied by Atomic Force Microscopy (AFM). The phenomenological observation of the hydrogen evolution reaction (HER) suggests the presence of electrocatalytic properties of the thin films obtained.
Keywords
HER , nickel sulfide , AFM , XPS , ECALE
Journal title
Journal of Electroanalytical Chemistry
Serial Year
2010
Journal title
Journal of Electroanalytical Chemistry
Record number
1673940
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