Title of article :
Characterization of growth of anodic antimony oxide films by ellipsometry and XPS
Author/Authors :
M.A. and Linarez Pérez، نويسنده , , Omar E. and Sلnchez، نويسنده , , Miguel D. and Lَpez Teijelo، نويسنده , , Manuel، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2010
Pages :
6
From page :
143
To page :
148
Abstract :
The processes occurring consecutively during anodic oxidation of antimony in buffered phosphate solutions are followed by in situ ellipsometry. In the first stages of anodization, soluble species formation followed by formation of a highly hydrated film takes place. At higher potentials, the growth of a single layer of Sb2O3 anodic film occurs. Oxygen evolution occurring simultaneously with oxide growth is also detected. Surface chemical analysis by XPS allowed obtaining the chemical state and composition of the anodic antimony oxide films. The procedure followed in order to carry out the spectra deconvolution due to overlapping of O1s and Sb3d photoemission lines is discussed. The binding energy values obtained for O1s and Sb3d signals as well as the O/Sb atomic ratio indicates that the anodic film formed at low or high potentials is composed by Sb(III) species only. Hydration as well as phosphate ions incorporation into the film is also demonstrated.
Keywords :
XPS , Oxide growth , ellipsometry , Antimony oxide
Journal title :
Journal of Electroanalytical Chemistry
Serial Year :
2010
Journal title :
Journal of Electroanalytical Chemistry
Record number :
1674489
Link To Document :
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