Author/Authors :
Horii، نويسنده , , S. and Akimoto، نويسنده , , K. and Ito، نويسنده , , S. and Emoto، نويسنده , , T. and Ichimiya، نويسنده , , A. and Tajiri، نويسنده , , H. and Yashiro، نويسنده , , W. and Nakatani، نويسنده , , S. and Takahashi، نويسنده , , T. and Sugiyama، نويسنده , , H. and Zhang، نويسنده , , X. and Kawata، نويسنده , , H.، نويسنده ,
Abstract :
We studied a buried interface reconstructed structure of the Ag/Si(111)3×3–Ag samples using grazing incidence X-ray diffraction with synchrotron radiation. We found that the 3 interface superstructure can be explained by an inequivalent-triangle (IET) model, which has been observed on the Si(1 1 1)3×3–Ag surface at low substrate temperatures by STM. The calculated structure factors of the IET model were found to be very close to our observed ones. The reliability factor (R-factor) using the IET model was about 25%. The R-factor was improved to be much less value, 12% by considering defects of Ag atoms forming the 3 structure. The Patterson map expected from the IET model having the defects was very similar to that calculated from the observed structure factors.
Keywords :
and reflection , and topography , Roughness , Surface relaxation and reconstruction , Interface states , Diffraction , morphology , surface structure , X-Ray scattering
