Title of article
Scanning tunneling microscopy and X-ray photoelectron spectroscopy of silver deposited octanethiol self-assembled monolayers
Author/Authors
Ohgi، نويسنده , , T. and Fujita، نويسنده , , D. and Deng، نويسنده , , W. and Dong، نويسنده , , H. Nejoh، نويسنده , , H.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2001
Pages
7
From page
453
To page
459
Abstract
Ag deposited self-assembled monolayers (SAMs) of octanethiol (CH3(CH2)7SH) have been studied using scanning tunneling microscopy and X-ray photoelectron spectroscopy (XPS). At the initial stage of Ag deposition, monatomic height islands, ∼7 × 1011 cm−2 in density, grow at the SAMs/Au(1 1 1) interface and become larger as more Ag atoms are deposited up to a full monolayer coverage of Ag. The differences of the nucleation density and the growth property between Ag and Au islands can be attributed to the higher mobility of Ag atoms and the difference of the molecular packing on these islands. XPS analysis of this structure (SAMs/Ag monolayer/Au) shows that the Ag 3d5/2 binding energy is shifted −0.3 eV with respect to bulk Ag, the C 1s binding energy is ∼0.3 eV higher than that before Ag deposition, and the S 2p3/2 binding energy exhibits little shift before and after deposition. The origin of the shift can be explained by the change of the dipole at the interface and the electrical isolation of alkyl chains from the surroundings.
Keywords
epitaxy , X-ray photoelectron spectroscopy , surface diffusion , SELF-ASSEMBLY , Scanning tunneling microscopy , silver
Journal title
Surface Science
Serial Year
2001
Journal title
Surface Science
Record number
1678238
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