Title of article
A theoretical treatment of void electromigration in the strip geometry
Author/Authors
Amar، نويسنده , , M.Ben and Cummings، نويسنده , , L.J. and Richardson، نويسنده , , G.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
11
From page
279
To page
289
Abstract
The void electromigration process in the strip geometry is investigated analytically and numerically. The void is assumed to travel either along the axis of symmetry of the metal strip or at the boundary. In each case, the shape, the velocity of the void and the characteristic electrical current are predicted.
Journal title
Computational Materials Science
Serial Year
2000
Journal title
Computational Materials Science
Record number
1678497
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