• Title of article

    Incident beam diffraction in electron stimulated desorption

  • Author/Authors

    Sieger، نويسنده , , M.T. and Orlando، نويسنده , , T.M.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2000
  • Pages
    10
  • From page
    31
  • To page
    40
  • Abstract
    We describe a new experimental technique utilizing incident beam diffraction in electron stimulated desorption (ESD) to determine the initial atomic bonding structure of desorbates. Diffraction in ESD can provide detailed information about the ground state surface bonding geometry of the absorber with sub-angstrom resolution of bond vectors. We discuss the role of electron diffraction in ESD, and demonstrate these ideas with experimental measurements of Cl+ ion ESD from chlorinated Si(111)-(7×7) and (1×1) surfaces.
  • Keywords
    Chlorine , Electron–solid diffraction , Electron–solid interactions , Electron stimulated desorption (ESD) , Silicon
  • Journal title
    Surface Science
  • Serial Year
    2000
  • Journal title
    Surface Science
  • Record number

    1678524