Title of article
Incident beam diffraction in electron stimulated desorption
Author/Authors
Sieger، نويسنده , , M.T. and Orlando، نويسنده , , T.M.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2000
Pages
10
From page
31
To page
40
Abstract
We describe a new experimental technique utilizing incident beam diffraction in electron stimulated desorption (ESD) to determine the initial atomic bonding structure of desorbates. Diffraction in ESD can provide detailed information about the ground state surface bonding geometry of the absorber with sub-angstrom resolution of bond vectors. We discuss the role of electron diffraction in ESD, and demonstrate these ideas with experimental measurements of Cl+ ion ESD from chlorinated Si(111)-(7×7) and (1×1) surfaces.
Keywords
Chlorine , Electron–solid diffraction , Electron–solid interactions , Electron stimulated desorption (ESD) , Silicon
Journal title
Surface Science
Serial Year
2000
Journal title
Surface Science
Record number
1678524
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