Title of article :
Incident beam diffraction in electron stimulated desorption
Author/Authors :
Sieger، نويسنده , , M.T. and Orlando، نويسنده , , T.M.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2000
Abstract :
We describe a new experimental technique utilizing incident beam diffraction in electron stimulated desorption (ESD) to determine the initial atomic bonding structure of desorbates. Diffraction in ESD can provide detailed information about the ground state surface bonding geometry of the absorber with sub-angstrom resolution of bond vectors. We discuss the role of electron diffraction in ESD, and demonstrate these ideas with experimental measurements of Cl+ ion ESD from chlorinated Si(111)-(7×7) and (1×1) surfaces.
Keywords :
Chlorine , Electron–solid diffraction , Electron–solid interactions , Electron stimulated desorption (ESD) , Silicon
Journal title :
Surface Science
Journal title :
Surface Science