Title of article :
The influence of strain on the diffusion of Si dimers on Si(001)
Author/Authors :
Zoethout، نويسنده , , E. and Gürlü، نويسنده , , O. and Zandvliet، نويسنده , , H.J.W. and Poelsema، نويسنده , , Bene، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2000
Pages :
6
From page :
247
To page :
252
Abstract :
The influence of lattice mismatch-induced tensile strain on the diffusion of Si dimers on Si(001) has been studied. The rate of surface diffusion of a Si dimer along the substrate dimer rows is relatively insensitive to tensile strain, whereas the rate of diffusion for a Si dimer across the substrate dimer rows is significantly enhanced. The insensitivity of the along row diffusion rate for tensile strain is attributed to the presence of a dissociative intermediate state of the ad-dimer during diffusion rather than diffusion as a solid unit.
Keywords :
surface diffusion , Silicon , Scanning tunneling microscopy
Journal title :
Surface Science
Serial Year :
2000
Journal title :
Surface Science
Record number :
1678795
Link To Document :
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