Title of article :
Structure determination of the Si(001)-(2×1)-H reconstruction by surface X-ray diffraction: weakening of the dimer bond by the addition of hydrogen
Author/Authors :
Lauridsen، نويسنده , , E.M. and Baker، نويسنده , , J. and Nielsen، نويسنده , , M. and Feidenhansʹl، نويسنده , , R. and Falkenberg، نويسنده , , Nathan G. and Bunk، نويسنده , , O. and Zeysing، نويسنده , , J.H. and Johnson، نويسنده , , R.L.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2000
Pages :
7
From page :
18
To page :
24
Abstract :
The atomic structure of the monohydride Si(001)-(2×1)-H reconstruction has been investigated by surface X-ray diffraction. Atomic relaxations down to the eighth layer have been determined. The bond length of the hydrogenated silicon dimers was found to be 2.47±0.02 Å, which is longer than the dimer bond of the clean (2×1)-reconstructed Si(001) surface and also 5% longer than the bulk bond length of 2.35 Å. The differences to the (2×1) structure of the clean surface are discussed in terms of the elimination of the weak π-bond character of the dimer bond by the addition of hydrogen.
Keywords :
hydrogen atom , Silicon , Surface relaxation and reconstruction , X-Ray scattering , Diffraction , and reflection
Journal title :
Surface Science
Serial Year :
2000
Journal title :
Surface Science
Record number :
1678806
Link To Document :
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