• Title of article

    Structure determination of the Si(001)-(2×1)-H reconstruction by surface X-ray diffraction: weakening of the dimer bond by the addition of hydrogen

  • Author/Authors

    Lauridsen، نويسنده , , E.M. and Baker، نويسنده , , J. and Nielsen، نويسنده , , M. and Feidenhansʹl، نويسنده , , R. and Falkenberg، نويسنده , , Nathan G. and Bunk، نويسنده , , O. and Zeysing، نويسنده , , J.H. and Johnson، نويسنده , , R.L.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2000
  • Pages
    7
  • From page
    18
  • To page
    24
  • Abstract
    The atomic structure of the monohydride Si(001)-(2×1)-H reconstruction has been investigated by surface X-ray diffraction. Atomic relaxations down to the eighth layer have been determined. The bond length of the hydrogenated silicon dimers was found to be 2.47±0.02 Å, which is longer than the dimer bond of the clean (2×1)-reconstructed Si(001) surface and also 5% longer than the bulk bond length of 2.35 Å. The differences to the (2×1) structure of the clean surface are discussed in terms of the elimination of the weak π-bond character of the dimer bond by the addition of hydrogen.
  • Keywords
    hydrogen atom , Silicon , Surface relaxation and reconstruction , X-Ray scattering , Diffraction , and reflection
  • Journal title
    Surface Science
  • Serial Year
    2000
  • Journal title
    Surface Science
  • Record number

    1678806