• Title of article

    An STM study of Cu on Si(001) in the c(8×8) structure

  • Author/Authors

    Liu، نويسنده , , B.Z. and Katkov، نويسنده , , M.V. and Nogami، نويسنده , , J.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2000
  • Pages
    6
  • From page
    137
  • To page
    142
  • Abstract
    We have studied the growth of Cu on the Si(001) surface over a range of growth temperatures and metal coverages. The only ordered phase seen by low energy electron diffraction (LEED), other than the 2×1 substrate pattern, was a c(8×8) phase which occurs at coverages as low as 0.05 monolayers. Scanning tunneling microscopy (STM) measurements show that the c(8×8) structure consists of an array of bright features, two per unit cell. We propose one possible atomic structure on the basis of the STM images.
  • Keywords
    Copper , Scanning tunneling microscopy , Silicon , and topography , surface structure , morphology , Roughness
  • Journal title
    Surface Science
  • Serial Year
    2000
  • Journal title
    Surface Science
  • Record number

    1678848