Title of article :
Behaviour of textured Ir layers exposed to the HFCVD environment of diamond
Author/Authors :
Pecoraro، نويسنده , , S. and Le Normand، نويسنده , , F. and Arnault، نويسنده , , J.C.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2000
Pages :
8
From page :
129
To page :
136
Abstract :
The growth of heteroepitaxied films is a great challenge for diamond microelectronics applications and iridium is one of the better substrates to achieve it. In the present study, the early stages of diamond growth on iridium have been studied by electron spectroscopy [Auger electron spectroscopy (AES), X-ray photoemission spectroscopy (XPS)]. A graphite layer is rapidly formed and its equivalent thickness was estimated from XPS data to some five to 10 monolayers. Then, the graphite layers are strongly modified by the highly reactive hydrogen radicals coming from the plasma. This induces a rehybridisation process into tetrahedral sp3 configuration which could constitute suitable sites for further diamond nucleation.
Keywords :
Auger electron spectroscopy , Graphite , iridium , X-ray photoelectron spectroscopy , chemical vapor deposition
Journal title :
Surface Science
Serial Year :
2000
Journal title :
Surface Science
Record number :
1679241
Link To Document :
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