Title of article
Dynamic force microscopy across steps on the Si(111)-(7×7) surface
Author/Authors
Guggisberg، نويسنده , , M. and Bammerlin، نويسنده , , M. and Baratoff، نويسنده , , A. and Lüthi، نويسنده , , R. and Loppacher، نويسنده , , Ch. and Battiston، نويسنده , , F.M. and Lü، نويسنده , , J. and Bennewitz، نويسنده , , R. and Meyer، نويسنده , , E. and Güntherodt، نويسنده , , H.-J.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2000
Pages
11
From page
255
To page
265
Abstract
Force microscopy in atomic resolution with an oscillating tip has been performed across monatomic steps of the Si(111)-(7×7) surface using the tunnelling current or frequency shift as the feedback parameter. The contrast of simultaneously recorded images in both feedback modes is discussed. A significant difference between tip–sample interactions on the upper and lower terrace close to a step is analyzed in detail by means of Kelvin-type measurements. No contact potential variation across the step is found. A simple model for the force contrast is suggested which takes into account the different effective interaction areas or volumes on the upper and the lower terrace.
Keywords
atomic force microscopy , surface structure , morphology , Roughness , Silicon , and topography
Journal title
Surface Science
Serial Year
2000
Journal title
Surface Science
Record number
1679286
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