Title of article
Algorithm for analysis of low-energy-resolution REELS; determination of inelastic electron scattering cross-sections and applications in quantitative XPS
Author/Authors
Tougaard، نويسنده , , S، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2000
Pages
7
From page
233
To page
239
Abstract
We present a simple algorithm for separation of elastic and inelastic electrons in low-energy-resolution REELS and for subsequent determination of the differential inelastic electron scattering cross-section. The application of the determined cross-sections for quantitative surface analysis and background correction with XPS is discussed.
Keywords
Iron , X-ray photoelectron spectroscopy , Electron energy loss spectroscopy (EELS) , Silicon
Journal title
Surface Science
Serial Year
2000
Journal title
Surface Science
Record number
1679426
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