Title of article :
Adsorption and desorption of Se on Si(100)2×1: surface restoration
Author/Authors :
Papageorgopoulos، نويسنده , , A.C. and Kamaratos، نويسنده , , M.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2000
Abstract :
This work entails a study of the adsorption of elemental Se on the reconstructed Si(100)2×1 surface. The investigation took place in an ultra high vacuum (UHV) by low energy electron diffraction (LEED), Auger electron spectroscopy (AES), thermal desorption spectroscopy (TDS) and work function (WF) measurements. The adsorption of one monolayer (1 ML) of Se at room temperature (RT) causes the transition of the reconstructed Si(100)2×1 surface to its original bulk terminated Si(100)1×1 configuration, while Se adatoms form a 1×1 structure by breaking the SiSi dimer bonds. The SiSe bond is strong (Eb=2.97 eV/atom), resulting in the formation of a SiSe compound. Above 1 ML, Se forms a SiSe2 compound with Eb=2.67 eV/atom. The heating that follows causes the desorption of Se up until 1000 K, where ΘSe=0.5 ML, and the Si(100)1×1 structure is changed back to the reconstructed Si(100)2×1 with the Se forming a 2×1 structure. The models of Se(1×1)/Si(100)1×1 and of the Se(2×1)/Si(100)2×1 structures are given.
Keywords :
Low energy electron diffraction (LEED) , Thermal desorption spectroscopy , Auger electron spectroscopy , Diffusion and migration , Surface relaxation and reconstruction , Silicon , Work function measurements
Journal title :
Surface Science
Journal title :
Surface Science