• Title of article

    Surface X-ray diffraction study on the initial oxidation of NiAl(100)

  • Author/Authors

    Stierle، نويسنده , , A. and Formoso، نويسنده , , V. and Comin، نويسنده , , F. and Franchy، نويسنده , , R.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2000
  • Pages
    13
  • From page
    85
  • To page
    97
  • Abstract
    The oxidation behavior of NiAl(100) surfaces was studied using surface X-ray diffraction. After oxidation of the preferentially Ni-terminated surface at 950°C for 500 s at 2×10−6 mbar O2, the formation of epitaxial Al2O3 in a (2×1) superstructure was observed. Along the (2×1) superstructure reciprocal lattice rods, two different modulation periods could be detected. The shorter period arises from the growth of 2 nm high θ-Al2O3 oxide islands in monoclinic structure, the longer period from a 0.76 nm thick Al2O3 layer. This layer exhibits a θ-Al2O3-like structure with strongly modified Al ion positions at the surface and at the metal/oxide interface.
  • Keywords
    Metal–insulator interfaces , Single crystal surfaces , Diffraction , Alloys , Aluminium oxide , Insulating films , and reflection , Oxidation , Low index single crystal surfaces , Growth , X-Ray scattering
  • Journal title
    Surface Science
  • Serial Year
    2000
  • Journal title
    Surface Science
  • Record number

    1679596