Title of article :
Step rearrangement on Si(001) surface during diborane exposure
Author/Authors :
Fujita، نويسنده , , Ken-ichiro Ichikawa، نويسنده , , Masakazu، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2000
Pages :
7
From page :
85
To page :
91
Abstract :
We observed step rearrangement on Si(001) surface during B adsorption by using scanning tunneling microscopy. The coverage of B atoms was varied by exposing the surface to diborane during observation. Our results showed that B atoms adsorbed on Si(001) are responsible for the step rearrangement. Variation of the terrace size was analyzed as a function of diborane dose. Comparing our results with previous reports, we ascribed the dominant factor in terrace narrowing during B adsorption to the reduction of the energies to create SA steps.
Keywords :
boron , Silicon , Step formation and bunching , Stepped single crystal surfaces , Scanning tunneling microscopy
Journal title :
Surface Science
Serial Year :
2000
Journal title :
Surface Science
Record number :
1679653
Link To Document :
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