Total-reflection X-ray absorption fine structure on liquid surface

A total-reflection X-ray absorption fine structure (TR-XAFS) method has been developed for studying solution surfaces. When the TR-XAFS method is applied to the air–solution interface under the condition of total reflection, the XAFS method becomes surface sensitive. Consequently, it is possible to analyze the ions segregated on the solution surface by surfactants and the monolayer of metal complexes at the solution surface in situ by the electron-yield and fluorescence methods.