Application of combined micro-proton-induced X-ray emission and micro-synchrotron radiation X-ray fluorescence techniques for the characterization of impact materials around Barringer Meteor Crater

A combined micro-PIXE and micro-SRXRF method has been used for the characterization of impact materials collected at the well-known Barringer Meteor Crater. Elemental maps were recorded and concentrations were determined by micro-PIXE method for the major constituents of samples. Micro-SRXRF technique was used for the complementary measurement of medium and high atomic number elements, especially the siderophilic ones. Altogether, approximately 40 elements were analyzed. These results elucidate many steps of the formation mechanism of the various impact-metamorphosed objects.